Curved Position Sensitive Detector - InelX-ray analysis (X-ray diffraction analysis) - one of the diffraction methods for investigating the structure of matter. The basis of this method is the phenomenon of X-ray diffraction on a three-dimensional crystal lattice. The method allows to determine the phase composition and structure of substances that includes a space group unit cell, its size and shape, and to identify the group symmetry of the crystal. X-ray analysis is the most common method of determining the structure of matter because of its simplicity. It is proposed to upgrade obsolete diffractometers using Inel (France) registration systems (in cooperation with Materials Lab company).


Download curved position-sensitive detector CPS specification